About Polytec
For over 50 years Polytec has delivered high-performance optical measurement systems geared for dynamic and static characterization of components. Polytec addresses surface metrology applications with innovative, high-precision, non-contact optical technology that works on rough, smooth and stepped surfaces. White-light interferometers of the TopMap family are established quality inspection tools for the controls laboratory, in production environments or in-line.
Resources
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Characterization of aluminum alloy sheets
Methods to determine the roping grade
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Introduction to non-contact full-field 3D surface metrology
Using macroscopic and microscopic optical profilers
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Next generation optical surface metrology
Micro.View and Micro.View+ optical profilers
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3D Surface Metrology Applications
Collection of articles "Surfaces in the right light"
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TopMap Optical Profilers
Surface Metrology in a New Dimension
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Surface Metrology Roughness Measurements
Profile and Areal Evaluation of Roughness
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Optical Polishing Quality Control
Characterizing surface texture, roughness, imperfections and scratches
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Coating process quality
Control surface texture, layer thickness, defects and wear